Single Atom Electron Emission from the Silicon Tip Coated by Calcium Fluoride with Samarium Dopant Ions
نویسندگان
چکیده
We present the first experimental results of the studying of field electron emission from sharp silicon tips covered by thin dielectric CaF2 layers containing Sm dopant ions. Some indications on the resonant tunneling of electrons from sharp silicon tip through dopant samarium ions inside the coating have been observed, which can be regarded as an implementation of one-atom electron source of a new type, based on dielectric coating of emitting tip.
منابع مشابه
Field - and Photoassisted Field Emission Studies of Calcium Fluoride Coated Silicon Tips
Measurements of field emission current-voltage and Fowler-Nordheim characteristics of Si tips covered by 100 nm-thick Ca& epitaxial layers have been for the first time performed. It was found that in spite of dielectric nature of the coating, the tips demonstrate high emissivity comparable with the diamond coated tips. Results of high resolution photoassisted field emission investigations of C ...
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